Business Meetings

Each year the Rasch Measurement SIG hosts a Business Meeting at the AERA annual conference. The meeting consists of a brief presentation about SIG business details followed by an engaging presentation from an invited speaker. The Rasch SIG has a rich history of dynamic speakers with engaging presentation topics (see below). This tradition has led to historically high Business Meeting attendance. The 2012 Business Meeting promises to be exciting as well. Please make plans to attend. See you in Vancouver!

Year	Chair	Secretary	Program Chair	Business Meeting Speaker (and Presentation Topic)
1987				Benjamin Wright & Richard Smith launch the SIG
1988	Benjamin Wright	Richard Smith	Richard Smith	Ben Wright - “Georg Rasch and measurement”
1989	Benjamin Wright	Richard Smith	Richard Smith	David Andrich - “The scientific revolution in social measurement” Wim van der Linden - “Derivation of the Rasch model”
1990	David Andrich	Mike Linacre	Mary Lunz	Barry McGaw - “Rasch scaling for monitoring and reporting on educational systems” Ben Wright - “Differences between scores and measures”
1991	David Andrich	Mike Linacre	Mary Lunz	David Andrich & Wim van der Linden - “The foundations of measurement”
1992	Wim van der Linden	Anne Fisher	Mary Lunz	Richard Woodcock - “Rasch technology and test engineering” Jack Stenner - “Meaning and method in reading comprehension measurement”
1993	Wim van der Linden	Anne Fisher	Mary Lunz	Ben Wright - “North American perspective on Rasch model” Eddy Roskam - “European perspective on Rasch model”
1994	George Engelhard, Jr.	Carol Myford	Betty Bergstrom & Richard Gershon	John de Jong & Grant Henning - “Language testing with Rasch measurement”
1995	George Engelhard, Jr.	Carol Myford	Richard Smith	Paul Holland - “The Rasch model and log-linear models for contingency tables”
1996	Geoff Masters	Betty Bergstrom	Richard Smith	Robert Mislevy - "Postmodern test theory"
1997	Geoff Masters	Betty Bergstrom	Richard Smith	John Keeves
1998	Allen Heinemann	Rita Bode	Richard Smith	B. Wright, D. Andrich, W. van der Linden, G. Engelhard, Jr., & G. Masters - “Rasch Measurement SIG 10th Anniversary: Where have we been? Where are we going?”
1999	Allen Heinemann	Rita Bode	Richard Smith	G. Engelhard, Jr., E. Gonzales, R. Hess, L. Ludlow, & J. Monsaas “Forum: Explaining measurement to non-specialists”
2000	Mary Lunz	Thomas O’Neill	George Karabatsos	Ben Wright - “Banking mixed rating scales”
2001	Mary Lunz	Thomas O’Neill	George Karabatsos
2002	Trevor Bond	Ed Wolfe	George Karabatsos
2003	Trevor Bond	Ed Wolfe	Randy Schumacker	David Andrich - “A trade-off between consistency of responses and precision of measurement”
2004	Randy Schumacker	Steve Stemler	Trevor Bond	Richard Smith - "History of Rasch Measurement"
2005	Randy Schumacker	Steve Stemler	Trevor Bond	Jean-Guy Blais - “The impact of Rasch measurement in Francophone countries”
2006	Thomas O’Neill	Ed Wolfe	William P. Fisher & Sharon Solloway	Richard Smith - “The ties that bind”
2007	Thomas O’Neill	Ed Wolfe	Sharon Solloway & Ed Wolfe	George Engelhard, Jr. - “Historical trends in measurement research”
2008	Ed Wolfe	Timothy Muckle	Dimiter Dimitrov & Diana Birnbaum	Paul de Boeck - “Explanatory item response models: a matrix representational framework”
2009	Ed Wolfe	Timothy Muckle	Diana Wilmot & Leigh Harrell	Mark Moulton - “Classical, IRT, and MIRT: a primer on test equating”
2010	Michael Young	Kenneth Royal	Leigh Harrell & Stephen Jirka	Brent Duckor - “Measuring teachers’ effectiveness”
2011	Michael Young	Kenneth Royal	Stephen Jirka & Daeryong Seo	Mark Wilson, Xiaohui Zheng & Leah Walker McGuire - “Formulating Latent Growth Using an Explanatory Item Response Model Approach”